High-frequency Characterization

Automated wafer scale characterization

• LUI, Spectra, Small signal response,RIN
  

Vector network analyzer up to 67 GHz

• Automated measurement, e.g. for varying currents or temperatures
  

Optical spectrum analyzer

• Wavelength range: 600~1700nm
  

Electrical spectrum analyzer

• Relative intensity noise, Phase noise 
  

Large signal measurement

• Generation of NRZ and PAM 2-16 bit pattern, up to 64 Gbaud
  
• Error analyzer for NRZ (64 Gbit/s) and PAM 2-16 (60 Gbaud)
  
• Signal analyzer (SNR, jitter, TDECQ, Eye diagrams) up to 70 GHz real time
  
• Arbitrary waveform generation with 92 Gsa/s
  
• Signal analyzer with 200 Gsa/s